INFRARED SPECTROMETER FOR IN SITU ANALYSIS OF ICES

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Same agency and NAICS · 80NSSC26P1245 — MOOG DEMONSTRATION RACK OR EQUIVALENT · National Aeronautics and Space Administration · $309,484
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Same agency and NAICS · 80NSSC26P1420 — SCANNING ELECTRON MICROSCOPE SERVICE CONTRACTS FOR HITACHI SEMS · National Aeronautics and Space Administration · $31,099
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