Federal Awards · Award

IGF::OT::IGF REGISTRATION X-RAY METROLOGY FOR THE SEMI-CONDUCTOR INDUSTRY, AUGUST 25-26, 2016 AT GAITHERSBU…

Award details are derived from public USAspending.gov records. Not a bid recommendation.

Award details

Award ID
DOC16177
Contractor
Awarding agency
Department of Commerce
Sub-agency / office
National Institute of Standards and Technology
Award amount
$0
Period of performance
May 3, 2016 – Aug 26, 2016
NAICS
561920 — Convention and Trade Show Organizers
Place of performance
MD
Parent award
DOCSB134114CQ0004

Public award description

IGF::OT::IGF REGISTRATION X-RAY METROLOGY FOR THE SEMI-CONDUCTOR INDUSTRY, AUGUST 25-26, 2016 AT GAITHERSBURG, MARYLAND.

Source: USAspending.gov

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