REPLACING WORN OUT FIELD EMISSION ELECTRON SOURCE ON A FIELD EMISSION SCANNING AUGER MICROSCOPE
Award details are derived from public USAspending.gov records. Not a bid recommendation.
Award details
- Award ID
- DOCSB134113SU0711
- Contractor
- Awarding agency
- Department of Commerce
- Sub-agency / office
- National Institute of Standards and Technology
- Award amount
- $0
- Period of performance
- Aug 14, 2013 – Oct 30, 2013
- NAICS
- 334516 — Analytical Laboratory Instrument Manufacturing
- PSC
- PSC 6650
- Place of performance
- MA
Public award description
REPLACING WORN OUT FIELD EMISSION ELECTRON SOURCE ON A FIELD EMISSION SCANNING AUGER MICROSCOPE
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