WAFER PROBES FOR USE IN TEST OF DIFFERENTIAL MICROWAVE INTEGRATED CIRCUITS. THE PROBES WILL BE USED WITH A…

Award details are derived from public USAspending.gov records. Not a bid recommendation.

Award details

Award ID: DOCSB134115SU0130
Contractor
Awarding agency: Department of Commerce
Sub-agency / office: National Institute of Standards and Technology
Award amount: $0
Period of performance: Feb 24, 2015 – Apr 29, 2015
NAICS: 334515 — Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals
PSC: PSC 6625 — Product Service Code 6625
Place of performance: FL

Public award description

WAFER PROBES FOR USE IN TEST OF DIFFERENTIAL MICROWAVE INTEGRATED CIRCUITS. THE PROBES WILL BE USED WITH A VECTOR NETWORK ANALYZER AND WAFER PROBE STATION.

Source: USAspending.gov

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