GAS FIELD ION SOURCE (GFIS) FOR AN ORION HELIUM ION MICROSCOPE. THE SOURCE IS REQUIRED FOR PROPER OPERATION…
Award details are derived from public USAspending.gov records. Not a bid recommendation.
Award details
- Award ID
- DOCSB134115SU0300
- Contractor
- Awarding agency
- Department of Commerce
- Sub-agency / office
- National Institute of Standards and Technology
- Award amount
- $0
- Period of performance
- Apr 30, 2015 – May 18, 2015
- NAICS
- 333314 — Optical Instrument and Lens Manufacturing
- PSC
- PSC 6650
- Place of performance
- NY
Public award description
GAS FIELD ION SOURCE (GFIS) FOR AN ORION HELIUM ION MICROSCOPE. THE SOURCE IS REQUIRED FOR PROPER OPERATION OF THE ORION HELIUM ION MICROSCOPE.
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