CUSTOMIZABLE FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (FIB-SEM) WITH IN SITU ATOMIC FORCE MICROSCOPE (…
Award details are derived from public USAspending.gov records. Not a bid recommendation.
Award details
- Award ID
- DOCSB134115SU1015
- Contractor
- Awarding agency
- Department of Commerce
- Sub-agency / office
- National Institute of Standards and Technology
- Award amount
- $1,626,480
- Period of performance
- Sep 22, 2015 – Apr 1, 2016
- NAICS
- 334516 — Analytical Laboratory Instrument Manufacturing
Public award description
CUSTOMIZABLE FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (FIB-SEM) WITH IN SITU ATOMIC FORCE MICROSCOPE (AFM) INTEGRATION CAPABILITY
Find out who's winning similar federal contracts
Discover comparable awards, related contractors, and agency purchasing history.
Related intelligence
- Agency: Department of Commerce
- PSC 6640 — Laboratory Equipment and Supplies
- Federal market intelligence software