ANALYSIS OF ATOM PROBE TOMOGRAPHY NASA STATEMENT OF WORK FOR ATOM PROBE TOMOGRAPHY OF TIAL TIAL BECOMES EMB…

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ANALYSIS OF ATOM PROBE TOMOGRAPHY NASA STATEMENT OF WORK FOR ATOM PROBE TOMOGRAPHY OF TIAL TIAL BECOMES EMBRITTLED AFTER AIR EXPOSURES OF 700 AND 800 C EVEN WITH MINIMAL OXIDATION ON THE SURFACE. WHILE THE OXIDATION IS MINIMAL, THE TENSILE DUCTILITY IS NEAR 0% AFTER THE EXPOSURE. SEM AND EPMA ANALYSIS HAVE DETECTED OXYGEN ONLY IN THE SURFACE OXIDE LAYER. ATOMIC PROBE MICROSCOPY SHALL BE PERFORMED IN THE NEAR SURFACE REGION OF A TIAL SAMPLE AFTER EXPOSURE IN ORDER TO STUDY THE DIFFUSION OF ELEMENTS DURING EXPOSURE. THE OBJECTIVE IS TO DETERMINE THE MECHANISM BEHIND THE HIGH TEMPERATURE EXPOSURE EMBRITTLEMENT. A TI-45AL-5NB-B-C SAMPLE, WHICH HAS BEEN EXPOSED TO 800 C FOR 200 HRS IN AIR, WILL BE PROVIDED BY NASA - GLENN RESEARCH CENTER. A LEAP ATOM-BY-ATOM THREE DIMENSIONAL RESOLVED TIME-OF-FLIGHT MASS SPECTROMETRIC ANALYSIS OF THE SAMPLE WITH TARGETED SPECIMEN PREPARATION BY FIB AT THREE LOCATIONS SHALL BE PERFORMED. THE LOCATIONS SHALL BE 2, 12, AND 24 M DISTANCE FROM THE OXIDE BASE METAL INTERFACE. THREE DIMENSIONAL RECONSTRUCTION AND DATA ANALYSIS FROM TWO DATASETS PER LOCATION SHALL BE PERFORMED. THE RESULTS SHALL BE COMPILED INTO A REPORT WITH GRAPHS AND PLOTS OF THE DATA. THE REPORT SHALL BE COMPLETED WITHIN 12 WEEKS FROM RECEIPT OF SAMPLE. THE SPECIMENS DO NOT CONTAIN ANY RADIOACTIVE, TOXIC, OR HAZARDOUS MATERIALS OR COMPONENTS. THE SERVICES WILL BE PERFORMED ON A BEST EFFORT BASIS.