PURCHASE OF A SINGLE TILT IN SITU ELECTRICAL FORCE NANO-PROBING SYSTEM AND A CORRELATION WORKSTATION WITH A…

Award details are derived from public USAspending.gov records. Not a bid recommendation.

Award details

Award ID: NNL08AF47P
Contractor
Awarding agency: National Aeronautics and Space Administration
Sub-agency / office: National Aeronautics and Space Administration
Award amount: $0
Period of performance: Jul 2, 2008 – Sep 30, 2008
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
PSC: PSC 6650
Place of performance: IL

Public award description

PURCHASE OF A SINGLE TILT IN SITU ELECTRICAL FORCE NANO-PROBING SYSTEM AND A CORRELATION WORKSTATION WITH A FRAME GRABBER FOR DIGITAL IMAGING. NANOFACTORY INSTRUMENTS WILL THEN INTEGRATE BOTH THE NANO-PROBING SYSTEM AND THE CORRELATION WORKSTATION WITH LANGLEY'S PHILLIPS CM200 TEM.

Source: USAspending.gov

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