Wireless Technology for Probes and Accessories for Nondestructive Inspection Testing Instruments
Award amount
$1,119,995Program and phase
SBIR · Phase IIAward year
2018Award details
- Awarding agency
- Department of Defense
- Branch
- Air Force
- Recipient company
- JENTEK SENSORS, INC.
- Proposal award date
- 2018-01-19
- Contract end date
- 2020-01-18
- UEI
- QEZ7G6S28R31
- Solicitation number
- 12.1
- Topic code
- AF121-214
Research abstract
Technology keywords
Not reported
Other awards by this recipient
Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.
- Field Inspection ET-Array System for Aircraft Structures
- MWM Array Bending Stress and Crack Detection In-Line Inspection Module
- MWM Array Bending Stress and Crack Detection In-Line Inspection Module
- ET-Arrays for NDT of Challenging Bolt Holes
- Enhanced Eddy Current Nondestructive Inspection Capability for Corrosion and Crack Detection of Aerospace Structures
Awards with the same topic code
Verified by an exact topic code match. This is not a text-similarity match.
- Wireless Eddy Current Testing Instrument
- Wireless Technology for Probes and Accessories for Nondestructive Inspection Testing Instruments
- Wireless Eddy Current Testing Instrument
Research funding history
104 SBIR/STTR records share this UEI (1994–2022). Reported award amounts total $40,039,479. Reported amounts are not federal obligations.
Phases: Phase I, Phase II, Phase II – Direct to Phase II
Agencies: Department of Defense, National Aeronautics and Space Administration, Department of Energy, Department of Transportation, Department of Agriculture