SBIR/STTR Research Award

SBIR Phase II: A Novel Electroless Nickel/Immersion Gold (ENIG) Surface Finish for Better Reliability of Electronic Assemblies

Award identifier 3560ef60b5fe78c9f423698b9ceecea0541b4cee15431a95b423791544663ef0Awarding agency National Science Foundation

Award amount

$750,000

Program and phase

SBIR · Phase II

Award year

2017

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Award details

Awarding agency
National Science Foundation
Branch
Not reported
Recipient company
Lilotree, L.L.C.
Proposal award date
2017-09-01
Contract end date
2019-08-31
UEI
RKKJFXHGH615
Solicitation number
Not reported
Topic code
MI

Research abstract

The Small Business Innovation Research (SBIR) Phase II project will scale-up development of eco-friendly, cost-effective novel Electroless Nickel Immersion Gold (ENIG) surface finish with high corrosion resistance and robust solder joints for better reliability of electronic assemblies. Conventional ENIG currently available in the market is prone to black-pad defects (hyper-corrosion related failures) associated with de-wetting of solder. ENIG also suffers from brittle solder joint failures. Due to these reasons, there are field failures and reliability concerns of electronic assemblies - component disconnection which lead to overall malfunction of electronic assemblies. Moreover, most ENIG manufacturers/suppliers provide cyanide-based gold chemistry which has health and ecological hazards. The novel ENIG eliminates black pads- corrosion related issues, achieves robust solder joints and provides improved quality and reliability of electronic assembly. Also, it uses cyanide-free chemistry for immersion gold process making it eco-friendly. This allows manufacturers to consume eco-friendly product while avoiding major field failures and resulting consequences. This new technology would be potential replacement for existing ENIG (with market value roughly about 2-3 billion USD/year). The primary focus of the project is to eliminate black-pad related failures and lead to robust, high quality and reliable solder joints for electronic assemblies. The root cause of black-pad defects has been identified as hyper corrosion activity at gold and nickel-phosphorous interface which involves nickel depletion and an enrichment of phosphorous in localized areas. During Phase I, interfacial engineering approach had been used to successfully eliminate black pads by achieving marked improvement in corrosion resistance. This has led to robust solder joints and elimination of brittle failures. In Phase II, the focus will be to scale-up development, optimize the product/chemistries and carry out further reliability testing. The main goal would be the rapid commercialization of novel ENIG into the market. This will involve development of the chemistries/process parameters for replenishing solution to make it market ready, economical and efficient for customers, further chemical testing for quality compliance (shelf life, quality standards, etc.) as well as reliability testing. Reliability testing will involve real world scenarios and various industry standard based testing including drop and vibration tests and solder ball shear and pull tests at extended thermal exposures.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Research funding history

2 SBIR/STTR records share this UEI (2016–2017). Reported award amounts total $974,986. Reported amounts are not federal obligations.

Phases: Phase II, Phase I

Agencies: National Science Foundation

Agency intelligence

National Science Foundation

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