Electron Optics for 4 MeV Ultrafast Electron Microscope

Electron microscopes with very high temporal and spatial resolution are required for a variety of applications. Realization of Ultrafast Electron Microscopes requires simulation codes that can accurately calculate high space charge electron bunch formation and propagation. Calabazas Creek Research Inc. in collaboration with Northern Illinois University proposes to develop an advanced Ultrafast Electron Microscope. It will use a relativistic beam voltage to reduce space charge effects and improve temporal and spatial resolution. Design of the optics will be done with a range of simulation code including CCR’s Beam Optics Analysis (BOA). This code has high order algorithms, integral analysis of non-linear magnetic materials and advanced meshing capabilities to allow very high accuracy trajectory calculations. BOA will be coupled with PhotoQE, a new CCR code that calculates properties of beams emitted from the photo-emitters required for UEM’s.