SBIR/STTR Research Award
Base Metal Electrode Capacitor Test Methods
Award amount
$100,000Program and phase
STTR · Phase IAward year
2015Award details
- Awarding agency
- Department of Defense
- Branch
- Missile Defense Agency
- Recipient company
- FUNDO SCIENCE CORPORATION
- Proposal award date
- 2015-04-28
- Contract end date
- 2015-10-27
- UEI
- HFBWDBZHPRJ3
- Solicitation number
- 2014.2
- Topic code
- MDA14-T003
Research abstract
Miniaturized base metal electrodes (BME) multilayer ceramic capacitors (MLCC) are of great interest for future missile applications as designers are striving to achieve smaller, lighter, cheaper, faster and better electronic assemblies without sacrificing long-term performance. Unfortunately, screening, reliability and qualifications criteria are either not available or not standardized. In the proposed STTR Phase I, FunDo Science, in collaboration with Penn State University, will investigate feasibility of a new way to implement voltage conditioning as an effective screening test. A test board-fixture assembly will then be developed that can be used for carrying out rapid and economic screening of 100% of COTS MLCCs. The test fixture will be designed for simultaneous testing of multiple capacitors, including capacitors with multiple sizes, rating and types. An improved realistic failure rate prediction model will be evaluated for surge current test (SCT) as a reliability indicator with respect to degradation mechanism initiated due to common manufacturing defects, namely cracks. The proposed test method and equipment will specifically evaluate the COTS parts suitability for military qualified established reliability (MIL-ER) applications. The test method and fixture will be evaluated for implementation in high volume manufacturing and standardization. Approved for Public Release 15-MDA-8161 (11 March 15)
Technology keywords
Not reported
Awards with the same topic code
Verified by an exact topic code match. This is not a text-similarity match.
- Advanced Electroanalytical Methods for Failure Mode Analysis and Screening of Base Metal Capacitors
- Base Metal Electrode Capacitor Test Methods