Electro-optic jitter and pulse characterization for X-ray free-electron laser sources

Mesa Photonics proposes a new method for online diagnostics at x-ray free electron laser facilities. This diagnostic can be fully automated, switching among alignment, jitter measurements, and pulse characterization. In this SBIR project, Mesa Photonics will develop a new diagnostic for measuring the time arrival between optical and x-ray ultrafast pulses. This technology is critical for the development, control, and utility of x-ray free electron lasers. Commercial Applications and Other Benefits: Low cost, efficient, coherent x-ray sources will improve medical imaging and diagnosis. Improved imaging for Homeland Security will result in safer ports and airports. These systems can also be used for non-destructive testing, microanalysis, and microscopy.