SBIR/STTR Research Award

SBIR Phase I: Integrating Electrical Flux Metrology with Third Party Machine tools for Precision On-board Measurements

Award identifier 8c151b11b4ed9f739e88046800f2180625649d057227cd37a4e26caff64d6fe3Awarding agency National Science Foundation

Award amount

$150,000

Program and phase

SBIR · Phase I

Award year

2014

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Award details

Awarding agency
National Science Foundation
Branch
Not reported
Recipient company
SmalTec, International
Proposal award date
2014-01-01
Contract end date
2014-06-30
UEI
ZEC5AZF1VKU6
Solicitation number
Not reported
Topic code
NM

Research abstract

This Small Business Innovation Research Phase I project will quantify the reliability of Electrical Flux Metrology (EFM) technology, compare its precision against existing state-of-the-art metrology processes, and verify the portability onto a third party machine tool. One of the greatest obstacles in machining micro-parts is inspection and verification. Prospective customers, partners and investors currently considering EFM technology do not have a measure for comparison that demonstrates how this new product will fit their process demands and portfolios. This project will (1) define a figure of merit for metrology standards with respect to precision and uncertainty. It will (2) directly compare the capabilities of EFM technology to the current state-of-the-art technologies of optical scanning and coordinate measurement machines. Finally, It will (3) integrate the EFM technology onto a third-party machine tool to verify the portability of the technology and determine how it alters the base figure of measurement. This is a non-contact and non-destructive in-situ metrology process, allowing parts machined on a platform to be measured and re-machined on the same platform. Comparing and integrating the EFM technology will verify the precision of this new technology. The result of this project will provide vital commercialization components and prove marketability. The broader impact/commercial potential of this project is focused toward miniaturized products with micro-sized features and applications that are rapidly expanding in the medical, automotive, and aerospace industries. As an example, the minimally invasive medical products market, supported by micro-metrology, was a $19 Billion industry in 2011. One of the most challenging aspects to micro-manufacturing is inspection of machined features. New manufacturing and hybrid processes to improve throughput and reduce operator time and material waste are required and addressed with the EFM technology, an elegant on-board metrology solution for micro-parts. As the parts and features of parts get smaller, better metrology is required. The EFM technology allows features to be measured that were previously only possible through destructive testing. This technology will advance micro-manufacturing and allow for higher precision parts to be manufactured more effectively. The micro manufacturing market is desperately asking for improved metrology of small features. EFM technology will fill this void. The commercial potential for this product is significant and will create new manufacturing jobs. Companies, small and large, will integrate this technology directly into the manufacturing process flow. This technology will enhance the manufacturing of improved and advanced micro-parts and micro-features in products.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Research funding history

2 SBIR/STTR records share this UEI (2011–2014). Reported award amounts total $297,130. Reported amounts are not federal obligations.

Phases: Phase I

Agencies: National Science Foundation

Agency intelligence

National Science Foundation

Back to SBIR/STTR Research Awards

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