Short Wave Infrared (SWIR) Test Capabilities for Imaging Sensors

ABSTRACT: There has been a strong worldwide interest in the development of technologies that would enable hardware in the loop (HWIL) stimulation of imaging sensors. Presently, a majority of the image projection systems are based on micro-resistor arrays, deformable mirror devices, spatial light modulators, and liquid crystal light valves. In this SBIR program, researchers of Fontus Applied Technologies propose an innovative scene projector system using our advanced electro-optic technology. The proposed scene generator is fast, wide spectrum range, fairly easy to fabricate, and low cost, compared with the currently available technologies. BENEFIT: Scene generation technique, a powerful tool for characterization and test of imaging sensor, will become essential lab tools for more and more research institutions, and the market will grow significantly as the growing investment flows into these areas. Success of this program will lead to a new generation of commercial scene generation systems for many imaging sensor development applications.