Man-Portable Multifrequency Microwave Inspection System

To address the MDA"s need for a nondestructive evaluation (NDE) system for nonconductive composite multilayer stacks, Physical Optics Corporation (POC) proposes to develop a new man-portable multifrequency microwave inspection (M3I) system based on the use of POC"s near-field microwave inspection module with custom-developed Fourier holographic property reconstruction algorithm augmented by an artificial neural network. The innovation in real-time parameter extraction based on complex reflectometry measurements will enable the M3I system to simultaneously identify structural defects (e.g., inclusions, voids, and disbonds), material layer thickness for manufacturing verification, and layer-by-layer RF properties (complex permittivity and permeability) in the S-X bands. Based on microwave inspection and utilizing commercial-off-the-shelf components, M3I is safe, inexpensive, and compact. As a result, the fully integrated M3I system is anticipated to be a man-portable tool to extract multi-layer composite properties, thus enabling high fidelity modeling and meeting MDA requirements. In Phase I, POC will demonstrate the feasibility of the M3I system by developing a concept system design for all-in-one, layer-by-layer composite structural and RF NDE. We will demonstrate the system performance through modeling, simulation, and assembly of a laboratory prototype. In Phase II, POC will develop a portable prototype of the M3I system for bench and field testing.