Solar/Lunar Exclusion Projection System

ABSTRACT: Addressing the Air Force need for a reduced-path-length solar/lunar exclusion sensor test capability that quantitatively characterizes off-axis rejection of bright light sources for validation and calibration of sensors in a cryo-vacuum environment, Physical Optics Corporation (POC) proposes to advance the development of the new solar/lunar exclusion projection (SLEP) system proven feasible in Phase I. The SLEP system is based on a novel integration of athermalized compact projection and polarization control optics with spatial light modulation. SLEP provides collimated source irradiance with known polarization characteristics over broadband infrared (1 to 20 micrometers) with a uniform intensity profile in a compact form operable in a cryo-vacuum environment. SLEP will enable measuring sensor performance to nominally 10^-9/sr of ratio of sensor response at an off-axis angle to normal incidence per solid angle with a 14 orders of magnitude dynamic range from 0 to 12 degrees with 0.1 degree angular resolution. In Phase II, we will develop a full SLEP system based on the Phase I results and implement identified improvements to enhance system performance. We plan to design and fabricate a SLEP prototype satisfying the Air Force requirements and test its performance in a cryo-vacuum chamber. BENEFIT: The proposed SLEP system will provide the Air Force with the required reduced-path-length solar/lunar exclusion sensor test capability that quantitatively characterizes off-axis rejection (OAR) of bright light sources for validation and calibration of sensors in a cryo-vacuum environment. SLEP will find commercial applications such as delivery and testing of advanced space systems, on-board spacecraft systems and commercial space simulation test facilities. The innovative system design allows reduced size and weight and facilitates easy incorporation into an existing space simulation test facility. Specifically, the SLEP system can be used in test facilities that operate at cryogenic temperature and need ground testing capabilities to characterize OAR sensors, such as in satellite industries.