SBIR/STTR Research Award

Photoluminescense for Solar Cell Crack Detection

Award identifier 3678ce8e12ae55dc81e497ffb4c3573088f8f081802ddb4fabee7dd57805e246Awarding agency Department of Energy

Award amount

$999,587

Program and phase

SBIR · Phase II

Award year

2011

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Award details

Awarding agency
Department of Energy
Branch
Not reported
Recipient company
Spire Corporation
Proposal award date
2011-08-15
Contract end date
2013-08-14
UEI
RG46KJGARZF4
Solicitation number
DE-FOA-0000508
Topic code
02 b

Research abstract

In the manufacturing process for photovoltaic (PV) cells and modules, a significant percentage of crystalline silicon wafers and solar cells contain microcracks that are difficult or impossible to detect with the human eye or currently available machine vision systems. These microcracks can propagate through the cells, resulting in power loss and cell breakage, due to mechanical and thermal stresses during cell fabrication, module assembly, and outdoor exposure. Photoluminescent imaging is being investigated as a means of crack detection in highly automated production lines, due to its potential for high-speed non-contact measurements. Image processing techniques will be applied to discriminate cracks from other material defects, enabling automated crack detection. Microcracks were detected by photoluminescence in both mono- and multi-crystalline silicon solar cells, using three different excitation wavelengths and two types of near-infrared cameras, a cooled silicon charge-coupled device and a cooled InGaAs focal plane array. In year 1, illumination sources and cameras will be tested to optimize image quality, while image processing software will be developed to identify microcracks in crystalline silicon cells. In year 2, a prototype automated high-speed photoluminescent solar cell inspection system capable of inspecting and handling 1200 cells per hour will be designed, built, and demonstrated. Commercial Applications and Other Benefits: Identifying and removing microcracked silicon wafers from the production line has clear benefits to solar cell and module manufacturers. Automating the inspection and reject part segregation processes reduces the cost of inspection and rework labor in cell and module production lines while increasing product yield, thereby reducing the cost of finished modules. The elimination of microcracked wafers and cells from modules will increase the lifetime (mean time to failure) of installed modules. This will increase the total energy production over the effective lifetime of PV systems, thereby reducing still further the energy generation cost. In order to advance these goals, Spire plans to integrate automated photoluminescent crack detection systems into its commercial cell testing equipment and module assembly lines.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Awards with the same topic code

Verified by an exact topic code match. This is not a text-similarity match.

Research funding history

429 SBIR/STTR records share this UEI (1983–2014). Reported award amounts total $73,907,551. Reported amounts are not federal obligations.

Phases: Phase I, Phase II

Agencies: Department of Defense, National Aeronautics and Space Administration, National Science Foundation, Department of Energy, Department of Health and Human Services, Department of Commerce

Agency intelligence

Department of Energy

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