Develop Accelerated High Power RF MEMs Switch and Phase Shifter Reliability Test Methodologies

Active phased array radars are expensive and solid state power and low noise amplifiers are a major component of that expense. Phase shifters employing low loss, high linearity Radio Frequency (RF) Microelectromechanical Systems (MEMS) switches are an enabling technology for Electronically Steerable Antennas that can be employed for radar and Electronic Warfare applications. This program will develop accelerated reliability test methodologies for high-power ohmic RF MEMS switches and phase shifters. Current testing approaches are time consuming and costly and hinder acceptance of this technology by government programs. Radant will develop test conditions in Phase 1 and a lifecycle test system in Phase 2 that will accelerate the mechanisms of ohmic MEMS switch failure. The dominant root cause of failure is excessive adhesion force between the contact surfaces. Accordingly, in order to accelerate these failures, test conditions will be designed to increase contact adhesion. This will include examining the impact of increased contact power handling as well as increased contact force. The completed accelerated lifecycle test system can also be utilized to make full burn-in of devices more practicable, without degrading the performance of surviving devices.