SBIR/STTR Research Award

Multipurpose Non-Destructive Inspection Test Kit

Award identifier 8c7b4e6045183b05a2553644508c2cef1736aec1b6b62fe77f35ef6c6090f425Awarding agency Department of Defense · Air Force

Award amount

$98,850

Program and phase

SBIR · Phase I

Award year

2011

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Award details

Awarding agency
Department of Defense
Branch
Air Force
Recipient company
American Testing Services LLC
Proposal award date
2010-12-17
Contract end date
Not reported
UEI
QZZQYFDCQA49
Solicitation number
2010.3
Topic code
AF103-239

Research abstract

It is important to be able to assess technicians and their ability to reliably detect critical defects without rejecting acceptable parts. To accomplish this, a series of test kits with a variety of acceptable and unacceptable anomalies needs to be available to perform POD studies. The aim of this proposal is threefold. 1)Identify the types and sizes of defects that need to be detected by categorizing them according to: NDT Method, Part Geometry, Defect Geometry, and Material. 2)Modernize the creation of artificial defects by collaborating with Mound Laser & Photonics Center to image cracks and recreate them at varying depths and lengths. We foresee the advantages to POD studies to include: a. Greater control over defect size, shape, and depth variation. Artificial defects will not be limited to straight lines and simple curves but instead can be jagged and multi-depth. b. Artificial defects that are much smaller when compared to EDM notches. c. Artificial defects that have little to no heat affected zone. 3)Choose specific materials, geometries and artificial defects to include in a POD kit for surface defects. Engineering drawings showing the final product(s) will include cost estimates for producing the kits. BENEFIT: Commercial benefits include test kits with manufactured defects that are more representative of defects found on in-service aircraft which will provide the opportunity to maximize POD. Additionally, test kits will be designed to overlap NDT methods such that one test kit can be used for multiple inspection disciplines. This will reduce the cost associated with POD studies.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Awards with the same topic code

Verified by an exact topic code match. This is not a text-similarity match.

Research funding history

3 SBIR/STTR records share this UEI (2011–2014). Reported award amounts total $953,328. Reported amounts are not federal obligations.

Phases: Phase I, Phase II

Agencies: Department of Defense

Agency intelligence

Department of Defense

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