Cathodoluminescence Defect Characterization for Medium Wavelength Infrared (MWIR) and Long-Wave Infrared (LWIR) HgCdTe

Traditional Cathodoluminescence (CL) tools are limited to the Near Infrared (NIR) region of the electromagnetic spectrum. Commercially available NIR CL tools are useful for studying wide bandgap semiconductors like CdTe. However, narrow gap materials such as Mid and Long Wavelength infrared (MWIR and LWIR) HgCdTe have spectral energies outside the limits of traditional CL tools. A proposal based on the Phase I program for building a CL characterization tool based around a cooled HgCdTe detector to study defects in MWIR and LWIR HgCdTe is outlined. The goal of the proposed Phase II program is to build, assemble and test a fully integrated CL tool capable of defect characterization and imaging MWIR and LWIR HgCdTe. The design and construction plan outlined in the proposal uses commercially available optical components and spectrometers and requires only the growth, processing and dewar integration of a MWIR or LWIR HgCdTe detector into a CL tool designed, constructed and optimized from MWIR and LWIR operation.