Radiation Hard, High Precision, Agile Star Tracker

In this Phase II program, a high-performance, rad-hard, high-functionality, back-illuminated, silicon-on-insulator (SOI) CMOS, Agile, Multi-functional-Pixel, Imager optimized sensor chip assembly (SCAMP SCA) will be developed and characterized for demanding spaceborne imaging applications, including high-functionality, environmentally robust star-tracking. The SCAMP SCA will include high performance features such as: snapshot-mode pixel operation, differential readout through the signal chain, which reduces common-mode noise, and a double-gate SOI MOSFET, which allows in-flight MOSFET threshold-voltage adjustment. This results in low noise circuits that are extremely effective in counteracting the deleterious effects of radiation-induced fixed pattern noise. The SCAMP SCA’s design will also include features to enhance star tracker functionality such as: high-speed and variable integration region-of-interest windowing, random individual pixel addressing, non-destructive readout, and on-chip 14-bit on-chip A/D converters. Importantly, the back-illuminated imager is designed to be manufactured on domestic commercial semiconductor fab lines. During Phase II performance tests, radiation testing, and extended lifetime tests will be conducted, and the SCAMP SCA will be qualified and the technology’s technology readiness level verified by domestic star tracker manufacturers.