Down Converter Hardware Development in a PXI (PCI (Peripheral Component Interconnect) Extensions for Instrumentation) Form Factor

Synthetic Instrumentation is an emerging technology in Test and Measurement (T&M) with considerable upside potential in terms of reducing test system footprint and cost, as well as enhancing Automatic Test System interoperability. A test system’s T&M capability predicated on SI is typically comprised of Signal Conditioning, Frequency Down Conversion, and Analog to Digital Conversion functional capability. The objective of this SBIR initiative is to develop a Down Converter in a Small Form Factor format called PXI (PCI Extension for Instrumentation) for use in a Synthetic Instrument Measurement environment. The Down Converter must be able of operating over a target frequency range of 100 KHz to 26.5 GHz. During Phase I an assessment will be performed of the feasibility of designing a RF/MW Down Converter in a PXI compliant format that meets targeted space and performance specification goals determined during Phase I. The proposed PXI design must also address power budget and Electromagnetic Interference (EMI) /Radio Frequency Interference (RFI) shielding issues. An advanced module prototype demonstrating physical layout feasibility is a Phase I output. The Down Converter design proposed for Phase II development should be capable of dual use applications in support of both commercial and Military (CASS) applications. BENEFITS: The Down Converter is the most critical component in the measurement path of a Synthetic Instrument (SI). Currently, a number of small form factor A/D converters exist in the PXI format, but PXI Down Converters with a frequency capability greater than 2.7 GHz are none existent. That is, the Down Converter is the “long pole” in the SI tent. If this project is successful, it is anticipated that the resulting small form factor PXI Down Converter will serve as a technology enabler for lighter/smaller portable/transportable SI based test systems and also provide a modernization/replacement technology, in support of both the DOD and Commercial market segments, for old rack & stack test systems which face obsolescence of their aging instrument suites. The end result will be the emergence of more highly mobile/small footprint test systems, lower recurring and non-recurring Automatic Test System (ATS) costs, and a clear migration path for obsolete systems which adopt the SI paradigm. The significance of this Phase I effort is that it will provide a firm foundation for the Phase II prototype development effort by mitigating technology risk via exploring the various pros and cons of various Down Converter PXI physical hardware implementation alternatives in conjunction with target specification and architectural design goals. The end result will be that the PMI team will enter Phase II with a firm product definition of the PXI Down Converter/ prototype artifact to be designed, developed, and demonstrated at minimum risk.