SBIR/STTR Research Award

Transmitted Wavefront Metrology of Multiple-Layer Dome Optics Using a Scanning Low-Coherence Dual Interferometer (SLCDI)

Award identifier 3489920ccf9214363218b03ebd31b76db2c724ab1ffc81100b903eae597b3037Awarding agency Department of Defense · Army

Award amount

$69,873

Program and phase

SBIR · Phase I

Award year

2006

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Award details

Awarding agency
Department of Defense
Branch
Army
Recipient company
ASE OPTICS
Proposal award date
2006-02-28
Contract end date
2006-08-31
UEI
Not reported
Solicitation number
2005.2
Topic code
A05-151

Research abstract

We propose a scanning low-coherence dual interferometery system that can accurately measure the optical thickness of hemispheric optical domes used as missile windows. The system has the unique capability to measure the optical thicknesses of individual layers within domes composed of multiple materials. The optical thickness map created during the scanning process is directly related to the wavefront transmission properties of the dome.

Technology keywords

Not reported

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Agency intelligence

Department of Defense

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