Development of Nuclear Event Detection and Circumvention Controller Technology

The thrust of this Phase II program is to develop a nuclear event detector and circumvention controller (NEDCC) system that will be used onboard the US Navy Fleet Ballistic Missile upgrade program. To optimize the performance and reliability of the NEDCC, two options will be pursued during the Phase II program. The lowest risk option will include a silicon chip with CMOS analog and digital circuitry along with a separate P-I-N detector diode and a light emitting diode (LED) that is needed for onboard system testing. In addition, AET, Inc. is researching the technology for a monolithic silicon chip containing a P-I-N diode. The Honeywell Solid State Electronics Center will be the partner of AET, Inc. for wafer fabrication and related services. AET, Inc. will fully characterize the part for electrical properties and radiation effects. AET, Inc. is uniquely qualified to perform this work because of the many years of experience that its engineers and consultants have in radiation effects on integrated circuits. In addition, the AET, Inc. team has extensive experience in modeling and design of integrated circuits for military applications. The AET, Inc. engineers as well as most of its consultants presently have SECRET security clearances.