Trusted IC System Utilizing IDDQ Fingerprints

This Phase I SBIR program will determine the feasibility of a unique sensor and test technology that measures trust levels in the operation of analog or digital integrated circuits (IC) through the use of device specific quiescent current (IDDQ) fingerprints. The IDDQ sensor is based on microelectronic magnetic field sensors, which are inexpensive, highly versatile, wide dynamic range, non-perturbative, and low power. The IDDQ sensor can be added to existing ICs at the wafer level, or it could be used to externally and non-destructively monitor an IC through current consumption. The IDDQ sensor operates by measuring the stray magnetic fields generated by current carrying interconnects or integrated components. The test portion of the technology compares a measured IDDQ fingerprint with an IDDQ fingerprint defined for a trusted circuit. Statistical analysis of the difference between the trusted and untrusted signatures is used to determine the trust level. Additionally, the test method permits the generation of unique, hidden, test sequence dependent, identification codes for any IC due to the effect of manufacturing process deviations and IDDQ hysteresis on the IDDQ fingerprint. The identification code can be used for forensic and system-level anti-tamper applications.