SBIR/STTR Research Award
GBI Testbed EKV Hardness Assessment and Hardness Enhancements
Award amount
$749,711Program and phase
SBIR · Phase IIAward year
2005Award details
- Awarding agency
- Department of Defense
- Branch
- Missile Defense Agency
- Recipient company
- GH SYSTEMS, INC.
- Proposal award date
- 2005-06-20
- Contract end date
- 2006-12-19
- UEI
- Not reported
- Solicitation number
- 2004.1
- Topic code
- MDA04-057
Research abstract
This Phase II effort is an extension of the Phase I SBIR entitled “GBI Testbed EKV Hardness Assessments and Hardness Enhancements”. Phase II will focus on evaluating specific Exoatmospheric Kill Vehicle (EKV) subsystem mechanical and electrical designs and piece part lists to determine the level of compliance of the current EKV design with the Missile Defense Agency (MDA) High Altitude Exoatmospheric Nuclear Survivability (HAENS) Standard (STD). The results of these evaluations will form the basis for defining future block upgrades and design modifications in order to progress the EKV toward full compliance with the MDA HAENS STD. The GH Systems team, including ATK Mission Research and Raytheon as subcontractors, will perform a detailed evaluation by updating and extending the analyses and evaluations performed in Phase I to quantify the hardness, design margins and probability of survival for the EKV parts, boards, and packages, and will use the results as the basis for developing a Survivability Assessment Data Base (SADB) tool. Phase II will also include a detailed evaluation of the mitigation strategies recommended in Phase I. The SADB tool will allow the Government and the EKV team to easily track the hardness maturity during the design evolutions of the EKV.
Technology keywords
Not reported
Awards with the same topic code
Verified by an exact topic code match. This is not a text-similarity match.
- Improved Proton Radiation hardened VLWIR HgCdTe Photodiode Technology
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- GBI Testbed EKV Hardness Assessment and Hardness Enhancements
- Electronic Techniques For Radiation Hardening of EKV Electro-Optics Subsystems