SBIR/STTR Research Award

Nondestructive Taper-Lok Fastener Hole Inspection Without Fastener Removal for Thick, Multi-Layer Structures

Award identifier 0efbc657205b06ab52e1a4c7e084c5787676082503527812542ad3defa42e861Awarding agency Department of Defense · Air Force

Award amount

$99,920

Program and phase

SBIR · Phase I

Award year

2004

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Award details

Awarding agency
Department of Defense
Branch
Air Force
Recipient company
POSITRON SYSTEMS, INC.
Proposal award date
2004-03-05
Contract end date
2004-12-05
UEI
Not reported
Solicitation number
2004.1
Topic code
AF04-134

Research abstract

The ability to detect cracks within Taper-Lok fastener holes associated with thick, multi-layer wing structures without removing the fastener presents significant challenges to existing nondestructive inspection technologies. Critical fastener hole inspections for sections of the B-1B wing structures require removal of the Taper-Lok fasteners followed by eddy current inspection, at a cost projected at $1 million per aircraft. These widely-deployed aircraft have been facing unanticipated near-term fatigue inspections of flight critical areas on the wings and wing carry through locations due to extensive operations beyond predicted. A new, advanced Nondestructive Inspection technology, Photon Induced Positron Annihilation (PIPA) has demonstrated the capability for thick, multi-layer damage detection and could enable rapid, low-cost inspection of B-1B wing structures without removal of the Taper-Loks, limiting risk to the aircraft structure. PIPA is capable of multi-layer analysis and measurement of fatigue, pre-cracking, and micro-cracks in metal alloys at a much earlier stage and with far better accuracy than any other technology, and can perform in-situ measurements on otherwise inaccessible structures, such as the multi-layer B-1B wing configuration. The basis for this project is to validate Positron Systems' new material inspection technology to detect operational fatigue damage in representative B-1B wing splice configurations.

Technology keywords

Not reported

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Agency intelligence

Department of Defense

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