Scanning High Resolution Birefringence Systems

Birefringence microscopy provides a necessary tool for the next generation electro-optic components. This effort builds on the great success of the Phase I effort that demostrated a benchtop system that could measure birefringent samples with high spatial resolution (~1mm) and high accuracy (0.1m). From this basis we will develop an engineering prototype that meets the needs of industry and the military: lightweight, compact, robust, low cost and high performance. Precise characterization of birefringent materials is a necessity for the next generation of electro-optic devices. These birefringent devices are in widespread use as modulators and switches. One key application of this microscope is the analysis of densely packed optical components needed for applications such as advanced optical communications and optical computing. Birefringence microscopy offers the ability to provide quality control and development feedback for these components. The benchtop prototype has already generated great interest. Three manufacturers have provided electro-optical components for testing. However, a commercial birefringent microscope must be a low cost analytical tool, capable of high speed characterization in a convenient and efficient manner and this is the focus of the Phase II effort.