SBIR/STTR Research Award
High Frequency (> 2 GHz) Inter-Aperture Direct Coupling and Radiation
Award amount
$70,000Program and phase
SBIR · Phase IAward year
2003Award details
- Awarding agency
- Department of Defense
- Branch
- Navy
- Recipient company
- TECH-KNOWLEDGE ADVANCEMENT, INC.
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
Existing and future Naval vessels require multiple antenna apertures for applications such as communications, electronic warfare (EW), and electronic sensor measures (ESM) at S-Band and higher frequencies. Since space is limited on a vessel, the radiofrequency (RF) apertures are required to operate in close physical proximity to each other and often in-band with other systems. This can result in interference between transmitting and receiving apertures. The objective of this proposal is to develop anintegrated, intuitive modeling and simulation tool to accurately analyze RF aperture performance in complex environments in a cost effective manner. This tool will characterize coupling between multiple RF apertures, installed transmit and receiveperformance of apertures, and radiation hazard (RADHAZ) zones due to RF apertures. The tool will also accurately characterize the effect of structures such as masts, railings, and other antenna structures including radomes composed of frequency selectivesurface (FSS) materials. The accuracy of the new toolsuite will be thoroughly validated using multiple empirical and deterministic modeling and simulation tools. The resulting RF aperture integrated tool suite will revolutionize the Navy's ability toinstall new systems on existing vessels and next-generation vessels. The resulting physics-based antenna modeling tool will revolutionize the developer's and the warfighter's ability to maintain effective communication links. This tool will enable theuser to perform analysis of extremely diverse environments with multiple systems over wide frequency ranges. Additionally, the analyst and the system designer will be able to use this tool to assess and guide the development of new RF systems with ordersof magnitude in improved accuracy and reduction of cost, production, and testing for multiple high frequency systems.
Technology keywords
Not reported