SBIR/STTR Research Award

Quantitative Techniques for Surface Characterization and Solderability Assessments of OSP - Coated Printed Wiring Board

Award identifier 80f08e13abbadbb1d284634be2a96cb5615fe775470ba9decabfeb5410f05238Awarding agency Department of Commerce

Award amount

$50,000

Program and phase

SBIR · Phase I

Award year

1996

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Award details

Awarding agency
Department of Commerce
Branch
Not reported
Recipient company
ECI TECHNOLOGY, INC.
Proposal award date
Not reported
Contract end date
Not reported
UEI
DLKDHJGNDQP3
Solicitation number
Not reported
Topic code
Not reported

Research abstract

Objectives of this project include the development of electrochemical techniques for measurement of (i) thinckness of OSP coatings, (ii) amount and type of copper oxides within and under the OSP coating, (iii) protective effectiveness of OSP coatings, and (iv) solderability prediction of OSP-coated PWBs. We will evaluate the effect of major parameters of the coating, storage, and soldering process on solderability of OSP-coated PWBs. In order to improve the interpretation of SERA signals, we will develop standardization procedures and prepare a set of calibration standards. The results will provide a foundation for (i) optimization and control of existing OSPs and their application processes, (ii) development of new processes, and (iii) cost savings in electronics due to solderability loses.

Technology keywords

Not reported

Other awards by this recipient

Verified by the same UEI. These are other public SBIR/STTR award pages, not a merged company record.

Research funding history

3 SBIR/STTR records share this UEI (1994–2009). Reported award amounts total $205,000. Reported amounts are not federal obligations.

Phases: Phase I

Agencies: Environmental Protection Agency, Department of Defense, Department of Commerce

Agency intelligence

Department of Commerce

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