Optimized Ion Extraction from an Electron Cyclotron Resonance Ion Source

142 Optimized Ion Extraction from an Electron Cyclotron Resonance Ion Source--FARTECH, Inc., 3146 Bunche Avenue, San Diego, CA 92122-2247; (619) 455-6607 Dr. Jin-Soo Kim, Principal Investigator Dr. Jin-Soo Kim, Business Official DOE Grant No. DE-FG03-97ER82381 Amount: $75,000 Highly charged ion sources with low beam emittance have been pursued worldwide for accelerator applications, atomic physics experiments and industrial applications. All applications would benefit from an improved ion source that could increase beam energies and allow more advanced research with more precise beams. This project will improve ion beam quality through 3D optimization of the beam extraction assembly. In Phase I, the capability of the 3D ARGUS code to handle all aspects of electrode optimization will be developed. This code will be used to simulate the plasma and sheath as well as the magnetic geometry and electrode configuration in 3 dimensions. The system will be optimized to achieve the maximum ion current while maintaining acceptable electrode voltage to prevent electrical breakdown. In Phase II, an optimized extraction system will be fabricated and tested along with further improvements and optimization of the 3D numerical analysis. Commercial Applications and Other Benefits as described by the awardee: The proposed optimized extraction for the electron cyclotron resonance ion source would provide a high quality, highly charged state ion source with parameters greater than is currently available. Such a source can be injected into cyclotrons and radio-frequency-quadrupoles for unique nuclear physics research. This technology can also be used for atomic and surface physics studies as well as industrial applications including ion-implantation, surface treatment and ion etching.