Mechanically Hard, Event Recorder with Nonvolatile Memory

A data recording system will be designed that will be smaller than the recorders presently available and contain high speed nonvolatile memory to guard against data loss when power fails. Various nonvolatile memory technologies will be investigated including a new memory technology called MRAM (magnetoresistive random access memory) which has all the characteristics required including fast write times, no wear out mechanisms, no loss of data when the battery fails, high shock tolerance, wide temperature range and low power. A 32k x 8 MRAM chip using NVEs proprietary GMR material which is currently being developed for Eglin AFB will be evaluated to determine its suitability to the needs of this program. Commercial high density packaging techniques will be evaluatedwhich can survive 100k g and samples of the selected technology will be tested with NVE's in-house High G Tester (HGT). Experience gained during a Phase I program for Eglin AFB will be used as a basis for this investigation. A data recorder, using high density nonvolatile memory components, high shock MCM technology, and a new miniature lithium battery technology will be designed to fit within a volume of 1 cubic inch and survive shocks over 100,000 g's.