SBIR/STTR Research Award
High Efficiency Silicon Drift X-Ray Detectors
Award amount
$100,000Program and phase
SBIR · Phase IAward year
2002Award details
- Awarding agency
- Department of Energy
- Branch
- Not reported
- Recipient company
- Photon Imaging, Inc.
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
70406 Nuclear physics seeks to understand the structure and interactions of atomic nuclei and the fundamental forces and particles of nature. To this end, the DOE continues the development of state-of-the¿art nuclear science facilities and accelerators. However, in order to fully exploit next-generation nuclear science facilities (for example, at the Rare Isotope Accelerator proposed for construction at Argonne National Laboratory), improved instrumentation and photon detectors will be required. This project will develop new silicon drift x-ray detectors with higher count rate performance and excellent energy resolution, which can be produced with less complex manufacturing and reduced cost compared to current competing x-ray detector technologies. In Phase I, prototype detectors will be developed. The approach will include calculations, computer simulations for the design of the new x-ray detectors, development of the fabrication process, construction of the detectors, and full characterization of the detectors with regard to their x-ray detection properties. Signal-processing electronics will be developed for read-out of a single x-ray detector, with emphasis on high count rate and low noise measurements suitable for accelerator and synchrotron applications. A prototype spectrometer will be developed in Phase II, which will be tested at Argonne National Laboratory. Commercial Applications and Other Benefits as described by the awardee: These x-ray detectors should find use at national nuclear science facilities and synchrotron sources. Other applications include portable x-ray spectrometers for environmental analysis and materials science, and for chemical analysis in industrial process control applications.
Technology keywords
Not reported