Magnetic Resonance Force Microscopy Using High-Q Multiple-T

Xidex Corporation and The University of Texas at Austin propose to demonstrate the feasibility of developing a magnetic resonance force microscope for single proton imaging. The proposed device will achieve high-precision, high-sensitivity measurement of the magnetic force using the. high-Q mode of multiple torsional oscillators fabricated from silicon as the sensing element. The UT Austin research group has already attained the spatial resolution required for single proton imaging by abandoning inductive detection schemes (NMR pickup coils, etc.) in favor of the multiple torsional oscillator system. This is the only group known to be actively pursuing magnetic resonance force microscopy with this approach. A factor of 100,000 improvement in signal-to-noise has been demonstrated in the laboratory. We now propose to extend the technique to its ultimate goal: single proton imaging. The target magnetic moment sensitivity of 2 x 10-28 J/T will easily permit single proton imaging (Mproton = 1.4 x 10-26 JIT) . The achievement will be demonstrated by non- intrusive detection of individual hydrogen atoms on surfaces. The demonstration of oscillators with a force sensitivity of Fmin =5x 10-16 N at room temperature and 2 x 10-19 N at 4 K, will be considered a complete Phase I success. BENEFITS:Xidex will develop, manufacture and sell MRFM tools for use within the semiconductor industry for production quality control in 300mm wafer fabrication facilities. These MRFM tools will also be sold for use in semiconductor characterization, and for imaging of single biological molecules. In addition, we plan to explore commercialization of quantum computation devices based on MRFM technology.