THIS PROPOSAL DISCUSSES A STATISTICAL METHODOLOGY TO DETERMINE THE SUSCEPTIBILITY OF MICROCIRCUIT PACKAGE TYPES TO DAMAGE CAUSED BY ELECTROSTATIC DISCHARGE (ESD).

THIS PROPOSAL DISCUSSES A STATISTICAL METHODOLOGY TO DETERMINE THE SUSCEPTIBILITY OF MICROCIRCUIT PACKAGE TYPES TO DAMAGE CAUSED BY ELECTROSTATIC DISCHARGE (ESD). A COMPARATIVE ANALYSIS OF THE VARIOUS MICROCIRCUIT PACKAGE TYPES IN MILITARY USE IN PROPOSED. EXTENSIVE USE OF EXISTING YIELD, FACTORY TEST, AND FLEET DATA IS PROPOSED. A PHASE I, FOUR-MONTH EFFORT IS PLANNED TO DETERMINE THE FEASIBILITY OF COLLECTING THE APPROPRIATE DATA AND OF APPLYING STATISTICAL TECHNIQUES TO DATA TO OBTAIN CREDIBLE RESULTS. ANTICIPATED PROBLEMS INCLUDE HOMOGENEITY OF DATA; DIVERSITY OF FABRICATION, ASSEMBLY, AND TEST METHODS; AND THE USE OF VARIOUS TYPES OF PROTECTIVE CIRCUITRY.