Estimation of the Electromagnetic Energy Protection Provided for Electronic Equipment by Various Dielectric Materials and Shielding Configurations

"A statistical methodology for susceptibility analysis of electronic devices under illumination of electromagnetic fields is proposed. The methods cast susceptibility data sets into a generalized form so that different data sets can be pooled to increasethe empirical basis for drawing inferences. Given underpinning data for a specific type of electronic device, the methods permit the device's susceptibility probabilities to be estimated in new scenarios for a wide range of EM stresses. Any problemconcerning the susceptibility of devices to radiated EM fields can be addressed using the methodology, pointing to commercial application in the EMI or IEMI areas. The methodology can provide more efficient means for commercial EMC/EMI testing ofcommercial and consumer elecronic equipment to standards requirements."