SBIR/STTR Research Award

Planar Technology for GaN Light-emitting Devices by Ion Implantation

Award identifier d252c9e218e442b83f855c6a0bc383dbb8656165ab511895ab0d4ea0a5c1ebbdAwarding agency Department of Defense · Missile Defense Agency

Award amount

$59,995

Program and phase

SBIR · Phase I

Award year

1997

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Award details

Awarding agency
Department of Defense
Branch
Missile Defense Agency
Recipient company
Implant Sciences Corporation
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
Not reported
Topic code
Not reported

Research abstract

The introduction of planar technology lo the fabrication of gallium nitride light-emitting and laser diodes will significantly reduce costs of manufacturing and allow flip-chip bonding of the lasers for efficient heat removal. Standard reactive ion etching of via holes to make contact to the rear silicon doped n-type region will be replaced by ion implantation. Silicon ions will be implanted through the undoped active region to form the shunting path for the contact. The p-type region at the surface will be created by implantation of magnesium ions. Shadow masks will define the appropriate regions. Materials analysis techniques will be used for locating the positions of the implants. Simple wire bonds will be made on the surface plane to evaporated metal contacts. Devices will be tested, and their operating characteristics will be analyzed. If the results are as promising as is anticipated, then Implant Sciences expects to become a manufacturer of nitride-based light emitters. Commercial Potential Nitride semiconductor devices including light-emitters and electronic amplifiers have vast commercial potential as display units, for optical storage, and for high power amplifier applications. Planar technology will help to reduce device processing costs.

Technology keywords

Not reported

Agency intelligence

Department of Defense

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