SBIR/STTR Research Award

Green Masking for Microcircuit Litography

Award identifier b9606773a3227ef7cd7a299018a68d9b047e4ab63be1d034d586047ca9c8c0aaAwarding agency Department of Defense · Air Force

Award amount

$80,000

Program and phase

SBIR · Phase I

Award year

1995

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Award details

Awarding agency
Department of Defense
Branch
Air Force
Recipient company
Alcedo, Inc.
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
Not reported
Topic code
Not reported

Research abstract

Current lithography techniques generally adopted by the semiconductor industry in the U.S. and other nations involve the use of masks which are prepared either by photolithography or by electron beam lithography. The masks consist of a glass plate on which a layer of chrome and another layer of resist are deposited. The resist is developed where it is irradiated and the chrome is etched thus leaving the pattern which is then imaged via steppers on the wafer. The preparation of masks generates undesirable chemical wastes which have to be specially disposed of to protect the environment. We propose to study the possibility of eliminating the chemical wastes by using a special glass whose opacity is directly affected by the electron beam. The glass can be used to image the pattern on the wafer and no resist or chrome is used or removed. Ideally, the glass can be restored to its original status when heated above a predetermined critical temperature. Thus, recycling of the mask becomes feasible under those conditions. Factors such as the resolving power of the glass, the amount of energy needed to change the opacity of the glass and the shelf life of the pattern written on the glass will be addressed.

Technology keywords

Not reported

Agency intelligence

Department of Defense

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