Laser-assisted Integrated Circuit Failure Detection

"The proposed research addresses integrated circuit (IC) failure detection using laser beam technology for examining internal chip structures, combined with the use of imaging techniques to interpret the laser images. A key advantage to our approach is thatit is a completely passive technique for detection of failure in ICs - the acquisition of images does not depend on the IC being in an electrically active mode. Our approach is based on the analysis of IC substrate chemical properties pertaining to opacityto laser emissions at various operational parameters (e.g., frequencies, modulation, etc.), and the resulting specification of requirements for IC laser illumination and capture of laser generated images. Multiresolution analysis and other imaging analysistechniques are used to examine the laser images to determine the existence of artifacts that may relate to the properties and characteristics of IC failure. These artifacts are then categorized for diagnostic use. With enhancements to the image resolution,this approach will be useful for both the current and future generations of ICs. If successful, the results of this research would form the basis for an entirely new method of detecting IC failures and degraded performance that are otherwise undetectableusing presently available testing techniques."