AUTOMATED IMAGE REGISTRATION FOR CLINICAL NEUROIMAGING

Not Available This proposal describes a revolutionary new approach to circuit card testing that may virtually eliminate the need for automatic test equipment at the SRU level. This is accomplished through the use of a combination of molecular test equipment, nanoprobes, and electrochemical failure indicators. The molecular test equipment is fabricated and embedded within the individual integrated circuit in the chip substrate. Nanoprobes contain molecular test equipment that connect between the surface and the substrate of the integrated circuit at various functional areas. An electrochemical indicator placed on the surface of the chip receives signals from the molecular test equipment and nanoprobes, initiating a chemical reaction that provides a visual indication to a technician that the integrated circuit is faulty. Elimination of the requirements for automatic test equipment and their associated test program sets for SRU test may provide the Air Force, DOD, and industry in general with savings in the tens of billions of dollars in non-recurring and recurring costs. In addition, system readiness can be improved as a result of faster repair and turnaround times for equipment repair. Also, this technology can be adapted to provide a wide range of information regarding device operation, such as hours or operation, etc.