SBIR/STTR Research Award
SENSITIVE LOW Z STRAIN GAGE
Award amount
$478,102Program and phase
SBIR · Phase IIAward year
1991Award details
- Awarding agency
- Department of Defense
- Branch
- Defense Threat Reduction Agency
- Recipient company
- APTEK, Inc.
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
THIS ACTIVITY WILL INVESTIGATE THE USE OF PVDF FILM FOR USE AS A LOW Z STRAIN GAGE. THE PVDF MATERIAL IS AN ORDER OF MAGNITUDE MORE SENSITIVE THAN PZT AS A PIEZOELECTRIC MATERIAL AND HAS AN ATOMIC NUMBER MUCH LOWER (LOW Z) THAN PRESENT RESISTIVE STRAIN GAGE MATERIALS. THEREFORE, PVDF AS A STRAIN GAGE WILL BE CAPABLE OF MEASURING MUCH LOWER LEVELS OF STRAIN THAN PRESENT GAGING TECHNIQUES, AND WILL BE CAPABLE OF MAKING THESE MEASUREMENTS IN HIGH DOSE SHINE THROUGH AREAS OF SPECIMENS TESTED UNDERGROUND. INCLUDED IN THIS EFFORT WILL BE FEASIBILITY STUDIES, GAGE ANALYSIS, FABRICATE SAMPLE GAGES, GAGE VERIFICATION AND CALIBRATION IN LABORATORY, AND SELECTION OF CANDIDATE GAGES FOR FURTHER VALIDATION IN PHASE II AGT AND UGT EFFORTS.
Technology keywords
Not reported