Develop Low - Weight / Low-Cost AC/DC regulated Convertor for V22 applications

Not Available As the critical dimensions in transistors shrink, they become increasingly difficult to fabricate. High yield and hence adequate yield analysis define the continued success of the industry, with metrology an essential aspect of yield analysis. Surface metrology needs for current devices are barely being met, particularly in terms of resolution and speed. Piezomax Technologies, Inc. proposes to test, in this Small Business Innovation Research Phase I project, the feasibility of a unique application of carbon nanotubes as probes in a novel multiple-compliant-probe sensor, a concept on which we have filed a provisional patent application. Combined with our existing high-speed actuation and control systems, the new sensor will allow nanometer-resolution surface metrology at video rates. The properties of a variety of carbon nanolithography, nanomagnetic imaging, and nanomechanical testing are also foreseen.