A Temporally Resolved Thermal Imager

There is a need for a robust, non-invasive system for the measurement and recording of single-event (non-repetitive) time-dependent high temperatures. Measurement periods for these applications can range from microseconds to several hundred milliseconds. Individual measurements must be made on the order of every microsecond or more frequent. A2Z Technologies Corporation proposes to design and develop instrumentation which is broadly applicable to high-speed temperature measurement applications for Government (i.e., DOD, NASA, DOE) and industrial applications (Engine manufactures, manufactures of explosives, etc.). Specific capabilities for the proposed thermal imager are 1) non-intrusive, high temperature measurements, 2) multiple point (256 x 256) simultaneous measurements, 3) time-resolved measurements with controllable sampling intervals (1 ms - 50 ms), and 4) operate in harsh physical and EMI environments. During the proposed 6 month effort, A2Z Technologies Corporation will perform initial measurements at Naval test facilities, test the interference environment produced by the pulsed x-ray sources, design the prototype instrument, and develop, test, and demonstrate a Phase I breadboard system. All Phase I activities are for the purpose of proving the system feasibility. In addition, a Phase I option is proposed that includes 1) additional system testing and 2) prototype system design.