WAVELENGTH DISPERSIVE X-RAY SPECTROMETERS FOR ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY

ALTHOUGH ENERGY DISPERSIVE SPECTROMETERS ARE STANDARD ON MANY ANALYTICAL ELECTRON MICROSCOPES, WAVELENGTH DISPERSIVE (WDS) X-RAY SPECTROMETRY HAS THE ADVANTAGES OF HIGH RESOLUTION AND SENSITIVITY TO A WIDE RANGE OF X-RAY ENERGIES, INCLUDING THOSE DUE TO LOW Z ATOMS. THE STANDARD WORKHORSE OF WAVELENGTH DISPERSIVE X-RAY SPECTROMETRY IS THEJOHANN BENT CRYSTAL SPECTROMETER. VERY FEW ANALYTICAL TRANSMISSION ELECTRON MICROSCOPES (ATEMS) ARE EQUIPPED WITH WDS DUE TO THE COMPLEXITY AND COST OF IMPLEMENTING THE STANDARD JOHANN SPECTROMETER UNDER THE CONSTRAINTS OF THE ATEM ENVIRONMENT. THIS PROJECT WILL PURSUE AN ALTERNATE IMPLEMENTATION OF THE JOHANN SPECTROMETER WHICH HAS A VARIABLE RADIUS BENT CRYSTAL. TECHNIQUES FOR MAKING SUPERLATTICE ARTIFICIAL WDS CRYSTALS ON FLEXIBLE SUBSTRATES WILL BE DEVELOPED AND THE RESULTING CRYSTALS TESTED.