ANNULAR WHOLE BODY PET SCINTILLATION CAMERA

Not Available A unique combination of orthogonal time of flight (TOF) mass spectrometry and low energy cluster ion bombardment will yield a Secondary Ion Mass Spectrometer (SIM) with superior sputter profile depth resolution and increased sensitivity for dopant and trace elemental analysis in multi-layer structures such as the indium antimonides. Phase I will include design work to incorporate the Phase I prototype with specialized exsitu analysis instrumentation soon to be delivered to the AFRL/MLPA bldg. 620 at Wright-Patterson Air Force Base. This instrumentation will already contain a one of a kind spectrometer useful for surface elemental analysis based on a recoiled ion spectrometry invented at Ionwerks. The combination of a unique SIMS spectrometer possessing unparalled performance with this instrument, would give the Air Force a capability for exsitu analysis of semiconductor thin films which would be unrivaled throughout the world.