Portable Total Integrated Scatter and Retro-Reflectance Instrument

Characterizing the optical properties of materials is becoming an increasing challenge as new materials, composite structures, coatings, etc. are constantly being developed. The ability to accurately measure the optical signature, specifically the Total Integrated Scatter (TIS) and Retro-Reflectance (or back-scatter), from a surface is useful in many applications including surveillance, interceptors, camouflage, targets, and decoys. The goal of this proposal is to determine the feasibility of designing and manufacturing a portable instrument to measure TIS and retro-reflection properties of surfaces. This instrument would not only be extremely useful in characterizing the TIS/backscatter signature of a target, but also in developing new coatings to tailor the effect of scattering, measuring the RMS roughness of high-energy laser optics, production line monitoring, etc. Portatility of the instrument would be a mojor advantage in signature characterization since witness samples may not be available and measuring the actual hardware using a laboratory instrument would be all but improssible.