SBIR/STTR Research Award

SBIR Phase I: A-Plane Silicon Carbide Wafers

Award identifier f1d609701e7d062a8035a092ec348a35df269902ffa78f19357d364aff51fefdAwarding agency National Science Foundation

Award amount

$100,000

Program and phase

SBIR · Phase I

Award year

2007

Explore This Research Award in CaptureIQ

Research the technology, evaluate the recipient and agency, identify related opportunities, and explore potential follow-on work with CaptureIQ.

Award details

Awarding agency
National Science Foundation
Branch
Not reported
Recipient company
Aymont Technology, Inc.
Proposal award date
Not reported
Contract end date
Not reported
UEI
Not reported
Solicitation number
NSF 06-598
Topic code
EL

Research abstract

This Small Business Innovative Research Phase I project aims to investigate the feasibility of producing low-defect-density wafers of a-axis oriented SiC. Aymont will grow boules of SiC in the a-axis direction by physical vapor transport (PVT) to produce these wafers. When available, wafers are normally fabricated out of boules grown in the c-axis direction. This project will model thermal gradients during PVT growth to promote growth in the a-axis direction as well as moderate crystal expansion in the {0001} direction. Gas-phase precursors will be used in addition to solid SiC to counteract Si depletion during PVT growth and control stoichiometry. Methods used in epitaxial growth of SiC will be utilized in the beginning stages of bulk growth in order to promote step flow growth in the a-axis direction. Implementation of these innovative methods will enable low-defect-density a-axis wafers by the end of Phase I. Silicon carbide is well-established as a substrate material for high-power devices, microwave devices and GaN-based emitters. To date the orientation primarily utilized for these applications is {0001), which is largely a result of the relative ease of crystal growth in this orientation rather than advantages in device properties. An analogy can be drawn to silicon, where the (111) orientation is easiest for crystal growth. Metal-oxide-semiconductor (MOS)-based devices in Si ended up being widely adopted on (100) rather than (111) because of the reduced surface-state density in this orientation. Advantages of a-axis material with respect to {0001}include a lower surface state density, lack of polarization charge, and smoother surfaces after SiC epitaxial growth. Epitaxial growth occurs successfully over a wider range of growth conditions on a-axis substrates than {0001}. Polarization-induced charge in GaN-based devices should be eliminated if GaN is grown on a-axis SiC. This may lead to more rapid development of GaN-based power switching devices. Wider acceptance of a-axis substrates requires that they be available for purchase for industrial and academic research and development at prices lower than for (0001) SiC substrates today. The proposed work should make this possible.

Technology keywords

Not reported

Agency intelligence

National Science Foundation

Back to SBIR/STTR Research Awards

Don't take our word for it. Ask AI about RFPCapture.

See what leading AI assistants have to say about RFPCapture and CaptureIQ.

Gemini opens without a prefilled question. The question is copied to your clipboard when the button works. You can also copy it here:

What is RFPCapture.com and its CaptureIQ platform from Smart Logic AI? How does it help federal contractors discover opportunities, evaluate bid/no-bid decisions, research government contracts, and prepare proposals? How does it compare with other federal capture platforms? Use independent sources where available.