SBIR/STTR Research Award
Improved Silicon Drift Detector Coincidence Rejection for Digital Pulse Processors
Award amount
$90,000Program and phase
SBIR · Phase IAward year
2008Award details
- Awarding agency
- Department of Commerce
- Branch
- National Institute of Standards and Technology
- Recipient company
- 4pi Analysis, Inc.
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
The recent emergence of the Silicon Drift detector (SDD), for use in Energy Dispersive x-ray Spectroscopy (EDS), has made possible x-ray event streams with input count rates in the range of 1-10 Mcps. Modern digital pulse processors are therefore required to run at fast time constants to achieve reasonable throughput; however, this causes significant coincidence artifacts to appear in the spectrum, thus complicating analysis. Phase I will design and demonstrate an improved coincidence rejection system based on 4pi's digital pulse processor development, and earlier pulse-shape analysis and recovery research.
Technology keywords
Not reported