SBIR/STTR Research Award
FLAW INSPECTION IN NONFERROUS CONDUCTORS USING MAGNETO- OPTIC DETECTION METHODS
Award amount
$193,000Program and phase
SBIR · Phase IIAward year
1986Award details
- Awarding agency
- National Science Foundation
- Branch
- Not reported
- Recipient company
- Sigma Research Corp
- Proposal award date
- Not reported
- Contract end date
- Not reported
- UEI
- Not reported
- Solicitation number
- Not reported
- Topic code
- Not reported
Research abstract
A NEW METHOD FOR ACHIEVING VISUALIZATION OF FLAWS IN NONFERROUS CONDUCTORS SUCH AS ALUMINUM IS PROPOSED. LESS DIRECT VISUALIZATION TECHNIQUES, INCLUDING EDDY CURRENT AND DYE PENETRANT TECHNIQUES, ALREADY EXIT. HOWEVER, THESE METHODS ARE TIME CONSUMING AND REQUIRE CONSIDERABLE SUPPORT AND PREPARATION. THE NEW METHOD PROPOSES TO ACCOMPLISH DIRECT VISUALIZATION OF FLAWS IN NONFERROUS MATERIALS USING MAGNETIC GARNET FILMSDETECTORS OF MAGNETIC FIELDS ASSOCIATED WITH EDDY CURRENTS. BY ILLUMINATINF SUCH FILMS WITH PLANE POLARIZED LIGHT AND USING A POLARIZING ANALYZER, THE MAGNETIC DOMAIN SSTRUCTURE OF THE FILM CAN BE MADE DIRECTLY VISIBLE. THAT IS,THE COMPONENT OF THEMAGNETIC FLUX PERPENDICULAR TO THE FILMSURFACE PRODUCES EITHER A DARK AREA, A LIGHT GREEN AREA OR AN INTERMEDIATE "GRAY" VALUE. SINCE THE DOMAINS ARE ALTERED MAGNETIC FIELDS ASSOCIATED WITH EDDY CURRENTS PERTURBED BY FLAWS, A METHOD OF DIRECT VISUALIZATION OF FLAWS MAY BE ACHIEVED.
Technology keywords
Not reported